发明名称 Magnetic memory device including storage element exhibiting ferromagnetic tunnel effect
摘要 <p>A magnetic memory device capable of preventing complication of the structure of an amplifier (sense amplifier) and enabling high-speed reading is provided. In this magnetic memory device, a memory cell is formed by a pair of first and second storage elements (4a, 4b) exhibiting a ferromagnetic tunnel effect and a pair of first and second transistors (5a, 5b) while an amplifier (53) detects potential difference between a bit line (BL) and an inverted bit line (/BL) connected to the pair of first and second storage elements. Thus, data can be readily read. Further, the value of a small current flowing to the bit line may not be detected dissimilarly to a case of forming the memory cell by a storage element exhibiting a ferromagnetic tunnel effect and a transistor. Consequently, the structure of the amplifier is not complicated. Further, no amplifier having a complicated structure may be employed, whereby high-speed reading is enabled. &lt;IMAGE&gt;</p>
申请公布号 EP1205937(A2) 申请公布日期 2002.05.15
申请号 EP20010309423 申请日期 2001.11.06
申请人 SANYO ELECTRIC CO., LTD. 发明人 KOUICHI, YAMADA
分类号 G11C11/15;G11C11/16;H01L27/22;(IPC1-7):G11C11/16 主分类号 G11C11/15
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