Wafer with opto-electronic circuits and test circuits, and method of testing said wafer,申请号EP19970102650-传众专利搜索

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发明名称	Wafer with opto-electronic circuits and test circuits, and method of testing said wafer
摘要
申请公布号	EP0860872(B1)	申请公布日期	2002.05.15
申请号	EP19970102650	申请日期	1997.02.19
申请人	EM MICROELECTRONIC-MARIN SA	发明人	GRANDJEAN, ANDRE;KUNZ, PASCAL
分类号	H01L23/544;(IPC1-7):H01L21/66	主分类号	H01L23/544
代理机构		代理人
主权项
地址

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