Ergonomic test apparatus for the operator-assisted testing of electronic devices

摘要

An ergonomic tester for an electronic device under test (EDUT). A tester circuit card is disposed within an enclosed chassis for creating a plurality of predetermined test conditions for the EDUT. A monolithic fixture frame formed from a single piece of material provides unitary lateral supports with pivot points for an ergonomic loading handle assembly, a unitary fan support and a unitary base for supporting a monolithic translatable carriage for engaging and positioning the EDUT during loading and testing. A spring-probe block connector assembly is retained by the unitary lateral supports of the monolithic fixture frame to engage a mating connector in the EDUT when loaded. The spring-probe block connector assembly has one or more mechanical locating elements each for engaging a corresponding mechanical locating element in the EDUT. The ergonomic loading handle assembly is movably engaged to the monolithic fixture frame and rotatably engaged to the monolithic translatable carriage so that the loading handle is moveable from a loaded position to an unloaded position. A single movement of the loading handle urges the EDUT on the monolithic translatable carriage toward and into engagement with the spring-probe block connector assembly or away from and out of engagement with the spring-probe block connector assembly. A spring-loaded pin in the ergonomic loading handle assembly operates to retain the loading handle at the loaded position, whereby the EDUT is held engaged to the spring-probe block connector assembly for testing. The apparatus is modular and may be embodied as a multi-bay testing station.