| 摘要 |
PROBLEM TO BE SOLVED: To solve such a problem that when a defective block is caused, manufacturing efficiency is reduced and it is hard to make surely a defective block detected after package a non-selection holding state. SOLUTION: A transistor 35 is connected to a decoding circuit 29 to which a block address signal is supplied in each block decoder 12. A block corresponding to this block decoder can be set to a non-selection holding state by turning off this transistor 35 in accordance with data latched by a latch circuit 36. Therefore, even when a defective block is detected by a burn-in test after packaging, this defective block can be set easily to a non-selective holding state. |
