SEMICONDUCTOR TESTING DEVICE, SEMICONDUCTOR TESTING SYSTEM, AND TESTING METHOD FOR SEMICONDUCTOR DEVICE

摘要

PROBLEM TO BE SOLVED: To realize a temporally parallel test between a predetermined circuit block having a self-diagnosis circuit and another circuit block in a testing method for an IC having a plurality circuit blocks. SOLUTION: In a technique for testing a semiconductor device 1 provided with a memory circuit block 28, the self-diagnosis circuit 34, and other circuit blocks (a logic circuit block 20, an analogue circuit block 24 and the like), at least supply of a power source voltage and an electric signal to the memory circuit block 28 and the self-diagnosis circuit 34 is controlled independently of supply of them to other circuit blocks.