发明名称 |
Material inspection |
摘要 |
An inspection station (6) has a ring of 370 nm LEDs (24) for low-angle diffuse illumination of flux. This stimulates inherent fluorescent emission of the flux without the need for flux additives or pre-treatment. A CCD sensor (20) detects the emission. An image processor generates output data indicating flux volume according to a relationship between emission intensity and volume over the surface of the flux. Intensity non-uniformity indicates either height non-uniformity or hidden voids, both of which give rise to defects after application of solder paste and reflow. The inspection is particularly effective for pre solder application flux inspection.
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申请公布号 |
US2002053589(A1) |
申请公布日期 |
2002.05.09 |
申请号 |
US20010970163 |
申请日期 |
2001.10.02 |
申请人 |
OWEN MARK D.;BOYLE ADRIAN;CONLON PETER |
发明人 |
OWEN MARK D.;BOYLE ADRIAN;CONLON PETER |
分类号 |
G01N21/64;B23K1/00;B23K3/08;G01N21/88;G01N21/956;(IPC1-7):B23K13/08;B23K15/02 |
主分类号 |
G01N21/64 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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