发明名称 Method for controlling a process line in semiconductor device manufacturing
摘要 <p>Using an algorithm for adding additional waiting times (60) to the process times of consecutively arranged processing devices (30) in a control unit (1) of a semiconductor device mass-production process line, the build-up of queues can be avoided resulting in equal time differences between any two manufacturing steps (101-118). The semiconductor devices (10) - the process line being the lithographic step comprising coating 104, exposure 112 and developing 116 - acquire stable process conditions and the yield is significantly increased due to a larger process window. <IMAGE></p>
申请公布号 EP1202144(A1) 申请公布日期 2002.05.02
申请号 EP20000123166 申请日期 2000.10.25
申请人 SEMICONDUCTOR300 GMBH & CO KG 发明人 SCHEDEL, THORSTEN;SEIDEL, TORSTEN
分类号 G05B19/418;H01L21/00;(IPC1-7):G05B19/418 主分类号 G05B19/418
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