发明名称 In situ dielectric stacks
摘要 Multiple sequential processes are conducted in situ in a single-wafer processing chamber, particularly for forming ultrathin dielectric stacks of high quality. The chamber exhibits single-pass, laminar gas flow, facilitating safe and clean sequential processing. Furthermore, a remote plasma source widens process windows, permitting isothermal sequential processing and thereby reducing the transition time for temperature ramping between in situ steps. In exemplary processes, extremely thin interfacial silicon oxide, nitride and/or oxynitride is grown, followed by in situ silicon nitride deposition. Cleaning, anneal and electrode deposition can also be conducted in situ, reducing transition time without commensurate loss in reaction rates.
申请公布号 US2002052124(A1) 申请公布日期 2002.05.02
申请号 US20010992215 申请日期 2001.11.14
申请人 RAAIJMAKERS IVO;WERKHOVEN CHRIS 发明人 RAAIJMAKERS IVO;WERKHOVEN CHRIS
分类号 C23C16/02;C23C16/34;C23C16/44;H01L21/28;H01L21/314;H01L21/318;H01L21/8242;H01L27/108;H01L29/51;H01L29/78;(IPC1-7):H01L21/31;H01L21/469;H01L21/320;H01L21/476 主分类号 C23C16/02
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