Electronic circuit suppresses access to memory for faulty address test of storage range in memory field

摘要

The circuit comprises a comparator (4) for a data value with associated rated data value to determine a faulty address. The data value has been read-out of an addressed memory range of the memory field (1) during testing.The circuit has also a faulty address memory (9). Between the comparator and faulty address memory is fitted a switch (7) to deposit the address as faulty one in the faulty address memory, dependent on a control signal (Hit). Independent claims are included for an integrated circuit and method of faulty address suppression.