发明名称 |
METHOD FOR FABRICATING SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND METHOD FOR FABRICATING PHOTOMASK |
摘要 |
PURPOSE: A method for fabricating a semiconductor integrated circuit device is provided to shorten an interval of time for fabricating a mask, by fabricating the semiconductor integrated circuit device and a photomask having a mask pattern including an organic layer in the same clean room. CONSTITUTION: A predetermined pattern is transcribed into the first semiconductor wafer by the first exposure treatment using the mask pattern including the organic layer. Whether the pattern of the photomask having the mask pattern including the organic layer is determined by inspecting the predetermined pattern transcribed into the first semiconductor wafer. A predetermined pattern is transcribed into the second semiconductor wafer by the second exposure treatment using the photomask having the mask pattern including the organic layer. |
申请公布号 |
KR20020030715(A) |
申请公布日期 |
2002.04.25 |
申请号 |
KR20010063613 |
申请日期 |
2001.10.16 |
申请人 |
HITACHI.LTD. |
发明人 |
HASEGAWA NORIO;SUGIMOTO ARITOSHI;TANAKA TOSHIHIKO;TERASAWA TSUNEO |
分类号 |
G03F1/08;G03F1/00;G03F1/54;G03F1/56;G03F1/84;G03F3/10;G03F7/20;H01L21/027;(IPC1-7):H01L21/027 |
主分类号 |
G03F1/08 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|