发明名称 Semiconductor device and fabrication method thereof
摘要 A semiconductor device includes first and second conductive layers which are electrically connected to each other through a contact plug. A first insulating film is formed on the first conductive layer and has a first opening which reaches the surface of the first conductive layer. A second insulating film is formed on the first insulating film and has a second opening at the same position as the first opening. The contact plug is filled in the first and second openings and has the surface which is substantially flush with the surface of the second insulating film and also contains a metal having a high melting point. The second conductive layer is formed on the second insulating film and on the contact plug.
申请公布号 US6372630(B1) 申请公布日期 2002.04.16
申请号 US19990332154 申请日期 1999.06.14
申请人 NIPPON STEEL CORPORATION 发明人 UCHIYAMA TOMOYUKI;SASAKI KAZUHISA;MURAKI TARO
分类号 H01L21/4763;H01L21/768;H01L23/48;(IPC1-7):H01L21/476 主分类号 H01L21/4763
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