发明名称 |
Method and apparatus for measuring wavefront aberrations |
摘要 |
An apparatus and method for measuring wavefront aberrations. The apparatus comprises a reflecting device (128) for reflecting selected portions of the wavefront (126), an imaging device (132) for capturing information related to the selected portions, and a processor (136) for calculating aberrations of the wavefront from the captured information. The method comprises reflecting selected portions of a wavefront (126) onto the imaging device (132), capturing information related to the selected portions, and processing the captured information to derive the aberrations. |
申请公布号 |
AU9462301(A) |
申请公布日期 |
2002.04.15 |
申请号 |
AU20010094623 |
申请日期 |
2001.09.21 |
申请人 |
JOHNSON AND JOHNSON VISION CARE, INC. |
发明人 |
BRETT A. DAVIS;MICHAEL J COLLINS;DAOUD, R ISKANDER;JEFFREY H. ROFFMAN;DENWOOD F. ROSS |
分类号 |
G01M11/02;A61B3/10;A61B3/103;G01J9/00 |
主分类号 |
G01M11/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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