发明名称 MICRO STATE OBSERVING METHOD AND SCANNING PROBE MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To provide an observing method and a scanning probe microscope capable of observing the electric characteristic state of an electric carrier such as mobility in an organic membrane, etc., with high resolution. SOLUTION: An object of observation 3 is irradiated with light 4, and a voltage is impressed on the object of observation 3 with a probe 11 having a sharp tip brought in contact with or close to the object of observation 3. Positive holes and electrons are isolated from excited molecules generated in the object of observation 3 by the absorption of the light, and charge obtained by this is extracted from the object of observation 3 and detected.
申请公布号 JP2002098621(A) 申请公布日期 2002.04.05
申请号 JP20000293170 申请日期 2000.09.26
申请人 SANYO ELECTRIC CO LTD 发明人 TSUJIOKA TSUYOSHI;HAMADA YUJI
分类号 G01Q30/00;G01Q60/00;G01Q60/16;G01Q60/18;G01Q60/22;H01L21/66;(IPC1-7):G01N13/10;G01N13/14 主分类号 G01Q30/00
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