Transient testing in electronic integrated circuits, uses variable delay circuit to provide clock signals for memory circuits which hold output from circuit under test

摘要

The test circuit delivers test signals (10) to a circuit under test (4). A source of profiles (1) is driven by the signal source and connects to the test circuit. A variable delay (12) driven by the signal source provides the clock signal both to a memory (6) connected to the test circuit, and to a second memory (8) receiving its input from the first memory (6).