发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide a manufacturing process which enables to reduce electrostatic destruction of switching elements on an active matrix substrate in the manufacturing process of liquid crystal display device. SOLUTION: By leaving a short ring for a counter measure of the electrostatic destruction on the active matrix substrate until the step of a process for attaching a FPC having a shorting bar, it is made possible to reduce the electrostatic destruction of switching elements caused by the operation from a chamfering process to the FPC attaching process.</p>
申请公布号 JP2002099222(A) 申请公布日期 2002.04.05
申请号 JP20010170460 申请日期 2001.06.06
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 EGUCHI SHINGO
分类号 G02F1/1368;G09F9/00;G09F9/30;H01L29/786;H05K1/14;H05K3/36;(IPC1-7):G09F9/00;G02F1/136 主分类号 G02F1/1368
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