发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a manufacturing process which enables to reduce electrostatic destruction of switching elements on an active matrix substrate in the manufacturing process of liquid crystal display device. SOLUTION: By leaving a short ring for a counter measure of the electrostatic destruction on the active matrix substrate until the step of a process for attaching a FPC having a shorting bar, it is made possible to reduce the electrostatic destruction of switching elements caused by the operation from a chamfering process to the FPC attaching process.</p> |
申请公布号 |
JP2002099222(A) |
申请公布日期 |
2002.04.05 |
申请号 |
JP20010170460 |
申请日期 |
2001.06.06 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
EGUCHI SHINGO |
分类号 |
G02F1/1368;G09F9/00;G09F9/30;H01L29/786;H05K1/14;H05K3/36;(IPC1-7):G09F9/00;G02F1/136 |
主分类号 |
G02F1/1368 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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