发明名称 |
HEMISPHERICAL GRAIN CAPACITOR AND METHOD FOR FABRICATING THE SAME |
摘要 |
PURPOSE: A hemispherical grain capacitor and a method for fabricating the same are provided to prevent degradation of electrical characteristic and obtain high capacitance by forming a capacitor of a hemispherical grain structure. CONSTITUTION: An interlayer dielectric(100) is formed on a semiconductor substrate. A contact plug(110) is formed by depositing and planarizing a conductive layer. An insulating layer pattern is formed by laminating and etching an oxide layer. An amorphous silicon layer(130) is laminated on a whole surface of the semiconductor substrate. A plasma process is performed on the amorphous silicon layer(130). A hemispherical grain formation prevention layer and a nitride layer are formed thereon. The hemispherical grain formation prevention layer, the nitride layer, and the amorphous silicon layer(130) are removed by using a chemical mechanical polishing method or an etch back method. The exposed insulating layer pattern is removed. A hemispherical grain layer(170) is formed on the amorphous silicon layer(130). A capacitor is completed by forming a dielectric layer(180) and an upper electrode(190) on a whole surface of a lower electrode(200).
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申请公布号 |
KR20020025381(A) |
申请公布日期 |
2002.04.04 |
申请号 |
KR20000057117 |
申请日期 |
2000.09.28 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHOI, SEONG JE;LIM, JAE SUN |
分类号 |
H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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