发明名称 HEMISPHERICAL GRAIN CAPACITOR AND METHOD FOR FABRICATING THE SAME
摘要 PURPOSE: A hemispherical grain capacitor and a method for fabricating the same are provided to prevent degradation of electrical characteristic and obtain high capacitance by forming a capacitor of a hemispherical grain structure. CONSTITUTION: An interlayer dielectric(100) is formed on a semiconductor substrate. A contact plug(110) is formed by depositing and planarizing a conductive layer. An insulating layer pattern is formed by laminating and etching an oxide layer. An amorphous silicon layer(130) is laminated on a whole surface of the semiconductor substrate. A plasma process is performed on the amorphous silicon layer(130). A hemispherical grain formation prevention layer and a nitride layer are formed thereon. The hemispherical grain formation prevention layer, the nitride layer, and the amorphous silicon layer(130) are removed by using a chemical mechanical polishing method or an etch back method. The exposed insulating layer pattern is removed. A hemispherical grain layer(170) is formed on the amorphous silicon layer(130). A capacitor is completed by forming a dielectric layer(180) and an upper electrode(190) on a whole surface of a lower electrode(200).
申请公布号 KR20020025381(A) 申请公布日期 2002.04.04
申请号 KR20000057117 申请日期 2000.09.28
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI, SEONG JE;LIM, JAE SUN
分类号 H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/108
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