发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 PURPOSE: A semiconductor device and its manufacturing method are provided to include an insulated gate field effect transistor(IGFET) having a particular gate electrode insulation structure. CONSTITUTION: A semiconductor device is disclosed including an insulated gate field effect transistor(IGFET) having a gate insulating layer(2), a gate electrode(3), and a source-drain layer(5). The IGFET may include a bird's beak insulating film(4) in a region in which the gate insulating layer(2) overlaps the source-drain layer(5). The bird's beak insulating film(4) may have a thickness that is greater than the gate insulating film(2). In this way, inter-band tunneling may be reduced. A plurality of IGFETs may include bird's beak insulating films having different configurations in accordance with operating conditions of the circuit in which the particular IGFET is included.
申请公布号 KR20020025830(A) 申请公布日期 2002.04.04
申请号 KR20010060691 申请日期 2001.09.28
申请人 NEC CORPORATION 发明人 NAKAMURA RYOICHI
分类号 H01L29/43;H01L21/265;H01L21/336;H01L21/8234;H01L21/8238;H01L21/8242;H01L27/088;H01L27/092;H01L27/108;H01L29/423;H01L29/49;H01L29/78;(IPC1-7):H01L29/78 主分类号 H01L29/43
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