发明名称 |
METHOD FOR FORMING HIGH DENSITY PLASMA INSULATION LAYER |
摘要 |
PURPOSE: A method for forming high density plasma insulation layer is provided to prevent a spot defect due to an argon sputtering by depositing an insulator using an HDP(High Density Plasma) deposition. CONSTITUTION: A semiconductor substrate(21) is chucked on an electrostatic chuck(22) of a high density plasma chamber(20). A helium(He) gases flow at the rear surface of the semiconductor substrate(21), thereby falling the temperature of the semiconductor substrate(21). A high density plasma insulator is deposited on the semiconductor substrate(21) by an HDP deposition. The high density plasma insulator is then cleaned by wet-cleaning.
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申请公布号 |
KR20020024942(A) |
申请公布日期 |
2002.04.03 |
申请号 |
KR20000056794 |
申请日期 |
2000.09.27 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, SU CHAN;NOH, JAE SEON |
分类号 |
H01L21/31;(IPC1-7):H01L21/31 |
主分类号 |
H01L21/31 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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