发明名称 METHOD FOR FORMING HIGH DENSITY PLASMA INSULATION LAYER
摘要 PURPOSE: A method for forming high density plasma insulation layer is provided to prevent a spot defect due to an argon sputtering by depositing an insulator using an HDP(High Density Plasma) deposition. CONSTITUTION: A semiconductor substrate(21) is chucked on an electrostatic chuck(22) of a high density plasma chamber(20). A helium(He) gases flow at the rear surface of the semiconductor substrate(21), thereby falling the temperature of the semiconductor substrate(21). A high density plasma insulator is deposited on the semiconductor substrate(21) by an HDP deposition. The high density plasma insulator is then cleaned by wet-cleaning.
申请公布号 KR20020024942(A) 申请公布日期 2002.04.03
申请号 KR20000056794 申请日期 2000.09.27
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, SU CHAN;NOH, JAE SEON
分类号 H01L21/31;(IPC1-7):H01L21/31 主分类号 H01L21/31
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