发明名称 Semiconductor device and method of producing the same
摘要 <p>High-speed and low-power-consuming transistors such as field effect transistors having strained Si channels and hetero-bipolar transistors are integrated with each other. Used here is a complex structure in which an MOSFET (10A) having a thin-film SiGe buffer layer (16A) and a strained Si channel (18A, 18B) are laminated on an insulating film (14) and an HBT (10B) having an SiGe base layer (34) formed on a thin-film SiGe layer (16B) by epitaxial growth and an Si emitter layer (36) formed on the SiGe base layer (34) are combined with each other. The thin-film SiGe layer (16A) formed on the insulating film of the MOSFET (10A) is made thinner than the counterpart (16B) of the HBT (10B). The thin-film SiGe layer (16A) formed on the insulating film of the MOSFET (10A) has Ge concentration higher than that of the counterpart (16B) of the HBT (10B). &lt;IMAGE&gt;</p>
申请公布号 EP1193754(A2) 申请公布日期 2002.04.03
申请号 EP20010308113 申请日期 2001.09.24
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 SUGIYAMA, NAOHARU;TEZUKA, TSUTOMU;MIZUNO, TOMOHISA;TAKAGI, SHINICHI
分类号 H01L21/331;H01L29/73;H01L21/02;H01L21/76;H01L21/8222;H01L21/8248;H01L21/8249;H01L21/84;H01L27/06;H01L27/12;H01L29/165;H01L29/737;H01L29/786;(IPC1-7):H01L21/84 主分类号 H01L21/331
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