发明名称 |
Semiconductor device and method of producing the same |
摘要 |
<p>High-speed and low-power-consuming transistors such as field effect transistors having strained Si channels and hetero-bipolar transistors are integrated with each other. Used here is a complex structure in which an MOSFET (10A) having a thin-film SiGe buffer layer (16A) and a strained Si channel (18A, 18B) are laminated on an insulating film (14) and an HBT (10B) having an SiGe base layer (34) formed on a thin-film SiGe layer (16B) by epitaxial growth and an Si emitter layer (36) formed on the SiGe base layer (34) are combined with each other. The thin-film SiGe layer (16A) formed on the insulating film of the MOSFET (10A) is made thinner than the counterpart (16B) of the HBT (10B). The thin-film SiGe layer (16A) formed on the insulating film of the MOSFET (10A) has Ge concentration higher than that of the counterpart (16B) of the HBT (10B). <IMAGE></p> |
申请公布号 |
EP1193754(A2) |
申请公布日期 |
2002.04.03 |
申请号 |
EP20010308113 |
申请日期 |
2001.09.24 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
SUGIYAMA, NAOHARU;TEZUKA, TSUTOMU;MIZUNO, TOMOHISA;TAKAGI, SHINICHI |
分类号 |
H01L21/331;H01L29/73;H01L21/02;H01L21/76;H01L21/8222;H01L21/8248;H01L21/8249;H01L21/84;H01L27/06;H01L27/12;H01L29/165;H01L29/737;H01L29/786;(IPC1-7):H01L21/84 |
主分类号 |
H01L21/331 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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