发明名称 |
MOS-gated power device with doped polysilicon body and process for forming same |
摘要 |
An improved MOS-gated power device 300 with a substrate 101 having an upper layer 101a of doped monocrystalline silicon of a first conduction type that includes a doped well region 107 of a second conduction type. The substrate further includes at least one heavily doped source region 111 of the first conduction type disposed in a well region 107 at an upper surface of the upper layer, a gate region 106 having a conductive material 105 electrically insulated from the source region by a dielectric material, a patterned interlevel dielectric layer 112 on the upper surface overlying the gate and source regions 114, and a heavily doped drain region of the first conduction type 115. The improvement includes body regions 301 containing heavily doped polysilicon of the second conduction type disposed in a well region 107 at the upper surface of the monocrystalline substrate.
|
申请公布号 |
US6365942(B1) |
申请公布日期 |
2002.04.02 |
申请号 |
US20000731169 |
申请日期 |
2000.12.06 |
申请人 |
FAIRCHILD SEMICONDUCTOR CORPORATION |
发明人 |
KOCON CHRISTOPHER B.;RIDLEY RODNEY S.;GREBS THOMAS E. |
分类号 |
H01L21/336;H01L29/04;H01L29/10;H01L29/739;H01L29/78;(IPC1-7):H01L29/76;H01L29/94;H01L31/062;H01L31/113;H01L31/119 |
主分类号 |
H01L21/336 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|