发明名称 MOS-gated power device with doped polysilicon body and process for forming same
摘要 An improved MOS-gated power device 300 with a substrate 101 having an upper layer 101a of doped monocrystalline silicon of a first conduction type that includes a doped well region 107 of a second conduction type. The substrate further includes at least one heavily doped source region 111 of the first conduction type disposed in a well region 107 at an upper surface of the upper layer, a gate region 106 having a conductive material 105 electrically insulated from the source region by a dielectric material, a patterned interlevel dielectric layer 112 on the upper surface overlying the gate and source regions 114, and a heavily doped drain region of the first conduction type 115. The improvement includes body regions 301 containing heavily doped polysilicon of the second conduction type disposed in a well region 107 at the upper surface of the monocrystalline substrate.
申请公布号 US6365942(B1) 申请公布日期 2002.04.02
申请号 US20000731169 申请日期 2000.12.06
申请人 FAIRCHILD SEMICONDUCTOR CORPORATION 发明人 KOCON CHRISTOPHER B.;RIDLEY RODNEY S.;GREBS THOMAS E.
分类号 H01L21/336;H01L29/04;H01L29/10;H01L29/739;H01L29/78;(IPC1-7):H01L29/76;H01L29/94;H01L31/062;H01L31/113;H01L31/119 主分类号 H01L21/336
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