发明名称 DEVICE AND METHOD FOR MEASURING QUANTITY OF UV-RAY AND CONTROL APPARATUS FOR UV LIGHT SOURCE
摘要 PROBLEM TO BE SOLVED: To provide inexpensive device and method for measuring the quantity of UV-rays stably for a long time and a control apparatus for UV light source using that device and method which can be used even under a high temperature state. SOLUTION: The device for measuring the quantity of UV-rays being used for measuring the quantity of light of a UV light source comprises a semiconductor light receiving element comprising a semiconductor layer 24 containing at least 0.5-50 atm.% of hydrogen, at least one group IIIA element and nitrogen, and an electrode 25 formed on the surface of a conductive substrate 23. The controller for UV light source comprises the device for measuring the quantity of UV-rays.
申请公布号 JP2002094106(A) 申请公布日期 2002.03.29
申请号 JP20000279842 申请日期 2000.09.14
申请人 FUJI XEROX CO LTD 发明人 YAGI SHIGERU;SUZUKI TOSHIHIKO;IWANAGA TAKESHI
分类号 G01J1/02;H01L21/205;H01L31/0264;H01L31/10;H01S5/0683;(IPC1-7):H01L31/10;H01L31/026;H01S5/068 主分类号 G01J1/02
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