发明名称 |
DEVICE AND METHOD FOR MEASURING QUANTITY OF UV-RAY AND CONTROL APPARATUS FOR UV LIGHT SOURCE |
摘要 |
PROBLEM TO BE SOLVED: To provide inexpensive device and method for measuring the quantity of UV-rays stably for a long time and a control apparatus for UV light source using that device and method which can be used even under a high temperature state. SOLUTION: The device for measuring the quantity of UV-rays being used for measuring the quantity of light of a UV light source comprises a semiconductor light receiving element comprising a semiconductor layer 24 containing at least 0.5-50 atm.% of hydrogen, at least one group IIIA element and nitrogen, and an electrode 25 formed on the surface of a conductive substrate 23. The controller for UV light source comprises the device for measuring the quantity of UV-rays.
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申请公布号 |
JP2002094106(A) |
申请公布日期 |
2002.03.29 |
申请号 |
JP20000279842 |
申请日期 |
2000.09.14 |
申请人 |
FUJI XEROX CO LTD |
发明人 |
YAGI SHIGERU;SUZUKI TOSHIHIKO;IWANAGA TAKESHI |
分类号 |
G01J1/02;H01L21/205;H01L31/0264;H01L31/10;H01S5/0683;(IPC1-7):H01L31/10;H01L31/026;H01S5/068 |
主分类号 |
G01J1/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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