| 摘要 |
PROBLEM TO BE SOLVED: To provide an emitted-light intensity distribution measuring device by which output values from each photodetector need not be corrected for obtaining accurate measured values. SOLUTION: The emitted-light intensity distribution measuring device has a semiconductor-laser holding member 1 holding a semiconductor laser 5 at a fixed position, the photodetector 2 receiving emitted light emitted from the semiconductor laser 5, a photo-detector rotary means 3 for circularly moving the photodetector 2 centering around the light-emitting point of the laser 5 or a section in the vicinity of the light-emitting point, and a circular-motion direction changing means 4 for changing the direction of the circular motion of the photodetector 2. The distribution of the intensity of the emitted-light is measured by using output values at each arcuate place of the photodetector 2.
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