A NON-INTRUSIVE METHOD AND APPARATUS FOR CHARACTERIZING PARTICLES BASED ON SCATTERING MATRIX ELEMENTS MEASUREMENTS USING ELLIPTICALLY POLARIZED RADIATION

摘要

A non-intrusive method of characterizing particles through inverse analysis of experimental data based on measurements using elliptically polarized radiation is provided. A database of theoretical absorption and scattering data sets for particles is compiled. Optimum settings for an experimental test to gather an experimental absorption and scattering data set are determined and the experimental test is conducted. The experimental absorption and scattering data set is then compared to the theoretical absorption and scattering data sets of the database of theoretical absorpiton and scattering data sets in order to determine an absorption and scattering data set which differs the least from the experimental absorption and scattering data set in order to characterize the particles.