发明名称 Method and structure for improved alignment tolerance in multiple, singularized plugs
摘要 An improved method and structure which increases the alignment tolerances in multiple, singularized plugs are provided. The invention discloses a novel method for forming individual plug contacts with increased surface area for improved registration between semiconducting layers. Also the improved plug contacts are particularly well suited to receiving contact formations which have any taper to them. IGFETS and other devices formed from this design can be used in a variety of beneficial applications, e.g. logic or memory.
申请公布号 US2002036302(A1) 申请公布日期 2002.03.28
申请号 US20010004661 申请日期 2001.12.04
申请人 MICRON TECHNOLOGY, INC. 发明人 FIGURA THOMAS A.
分类号 H01L21/768;(IPC1-7):H01L27/10 主分类号 H01L21/768
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