发明名称 COATINGS ON REFLECTIVE MASK SUBSTRATES
摘要 A process for creating a mask substrate involving depositing: 1) a coating on one or both sides of a low thermal expansion material EUVL mask substrate to improve defect inspection, surface finishing, and defect levels; and 2) a high dielectric coating, on the backside to facilitate electrostatic chucking and to correct for any bowing caused by the stress imbalance imparted by either other deposited coatings or the multilayer coating of the mask substrate. An film, such as TaSi, may be deposited on the front side and/or back of the low thermal expansion material before the material coating to balance the stress. The low thermal expansion material with a silicon overlayer and a silicon and/or other conductive underlayer enables improved defect inspection and stress balancing.
申请公布号 EP1190276(A2) 申请公布日期 2002.03.27
申请号 EP20000941241 申请日期 2000.06.06
申请人 THE REGENTS OF THE UNIVERSITY OF CALIFORNIA 发明人 TONG, WILLIAM, MAN-WAI;TAYLOR, JOHN;HECTOR, SCOTT, D.;MANGAT, PAWITTER, J., S.;STIVERS, ALAN, R.;KOFRON, PATRICK, G.;THOMPSON, MATTHEW, A.
分类号 G03F1/00;G03F1/24;G03F1/38;G03F1/46;H01L21/027 主分类号 G03F1/00
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