发明名称 Determining transistor widths using the theory of logical effort
摘要 An apparatus and method for finding suitable transistor sizes for complex logic networks. An electrical "logical effort model" of a logic circuit is made by replacing each logic element with a simple electrical model and retaining the wiring topology of the original circuit. The logical effort model is a DC circuit with parameters that depending only on the gain chosen for the logic elements in the critical path, the stray capacitance of critical connections, and the logical effort of each logic element. A circuit simulation of the logical effort model produces voltages proportional to desired transistor widths. In working on the electrical model, the circuit simulator merely solves the set of simultaneous equations implied by the model. Alternate methods are also described.
申请公布号 AU8890001(A) 申请公布日期 2002.03.26
申请号 AU20010088900 申请日期 2001.09.07
申请人 SUN MICROSYSTEMS, INC. 发明人 IVAN SUTHERLAND;JOSEPHUS EBERGEN
分类号 G06F17/50 主分类号 G06F17/50
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