发明名称 PACKAGING STRUCTURE OF SEMICONDUCTOR DEVICE AND DISPLAY OF STRUCTURE AND ITS MANUFACTURING METHOD
摘要 <p>PROBLEM TO BE SOLVED: To solve the problem where a first substrate 1 is warped after salient electrodes 4a and 4b of a semiconductor device IC are subjected to thermocompression bonding, and display around a semiconductor package section 15 on the screen of a liquid crystal panel L becomes irregular for decreasing the quantity of the liquid crystal panel L, in the conventional packaging of the semiconductor device. SOLUTION: A stress restraining substrate F1 is provided between the display panel 1 and semiconductor device IC, continuity sections 9a and 9b for allowing the semiconductor device IC and the wiring pattern of the display panel 1 to conduct electricity are provided on the stress restraining substrate F1, and at the same time, the stress inhibition substrate F1 is pulled into the section between the packaging region of the display panel 1 and the semiconductor device IC for crimping via paste- or filmy adhesives 6A and 6B.</p>
申请公布号 JP2002076208(A) 申请公布日期 2002.03.15
申请号 JP20000254808 申请日期 2000.08.25
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 FUJITA HIKARI;OKAMOTO JUNICHI
分类号 G02F1/1345;G09F9/00;H01L21/60;H01L23/12;H01L23/32;H05K3/32;(IPC1-7):H01L23/32;G02F1/134 主分类号 G02F1/1345
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