发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide a method for manufacturing a semiconductor device capable of further improving on-current characteristics even when a TFT is formed from a polycrystalline amorphous semiconductor film, and compressing its unevenness. SOLUTION: The method for manufacturing the semiconductor device comprises the steps of forming the semiconductor film made of the amorphous semiconductor film on a substrate 50 made of a glass by a low temperature process, and then making the semiconductor film polycrystalline by laser annealing (crystallizing step). The method further comprises the step of then heat treating a substrate 20 in a high temperature atmosphere at 400 to 600 deg.C in a heat treating unit 600 (heat treating step). In this case, a treating chamber 610 is evacuated to exhaust contaminated atmosphere therein, then clean gas is introduced into the chamber and then heat treated. Thus, a surface of the semiconductor film can be held clean.</p>
申请公布号 JP2002076349(A) 申请公布日期 2002.03.15
申请号 JP20000257887 申请日期 2000.08.28
申请人 SEIKO EPSON CORP 发明人 TAKENAKA SATOSHI
分类号 G02F1/136;G02F1/1368;H01L21/20;H01L21/336;H01L29/786;(IPC1-7):H01L29/786 主分类号 G02F1/136
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