发明名称 HIGH FREQUENCY SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a high frequency semiconductor device, which has an amplifier with high thermal stability and reduced degradation of high frequency characteristics. SOLUTION: The high frequency semiconductor device comprises a power amplifier 10, where a driver stage 12 of the amplifier 10 comprises multi-finger HBTs 121 to 12n, which form multi-stages with one emitter basic HBTs connected in parallel, an output stage 14 of the amplifier 10 comprises multi-finger HBT 141, which forms single stage with two emitter basic HBTs connected in parallel; to prevent a pn-junction capacitor between an emitter layer and a base layer in the driver stage 14 from increasing and to eliminate thermal non-uniformity in the output stage 14.
申请公布号 JP2002076014(A) 申请公布日期 2002.03.15
申请号 JP20000261329 申请日期 2000.08.30
申请人 MITSUBISHI ELECTRIC CORP 发明人 MORIWAKI TAKAO
分类号 H01L29/73;H01L21/331;H01L21/8222;H01L27/082;H01L29/205;H01L29/417;H01L29/423;H01L29/737;H03F1/30;H03F3/19;(IPC1-7):H01L21/331;H01L21/822 主分类号 H01L29/73
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