发明名称 SEMICONDUCTOR DEVICE AND METHOD OF DESIGNING AND MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To make insulation breakdown less likely to occur in a gate oxide film, even is wiring for connecting cells is long. SOLUTION: A drain terminal 6 of a logic cell A and a gate terminal 7 of a logic cell B are connected with a wire L. A capacity 1 is formed in the logic cell B, and the capacity 1 and the gate terminal 7 are connected with a wiring 8.
申请公布号 JP2002076273(A) 申请公布日期 2002.03.15
申请号 JP20000254357 申请日期 2000.08.24
申请人 SEIKO EPSON CORP 发明人 KURASHIMA KENJI
分类号 H01L23/52;H01L21/3205;H01L21/82;H01L21/822;H01L27/04;(IPC1-7):H01L27/04;H01L21/320 主分类号 H01L23/52
代理机构 代理人
主权项
地址