发明名称 Automated multi-chip module handler, method of module handling, and module magazine
摘要 An automated method of handling multi-chip modules (MCMs) in conjunction with automated module testing. The method includes providing a plurality of MCMs in a magazine at an input location and positively displacing the magazine through an indexing device. At the indexing device, the MCMs are each positively retreived and guided to a test site, tested, and positively ejected for sorting according to the results of the testing. Depending on the testing results, the MCMs may be placed in a shipping tray or in a discard bin. The emptied magazine is further displaced to an output location where it may be stacked with similar emptied magazines.
申请公布号 US6356094(B1) 申请公布日期 2002.03.12
申请号 US20000725589 申请日期 2000.11.29
申请人 MICRON TECHNOLOGY, INC. 发明人 TVERDY MARK A.;LAYER WILLIAM C.;KRESS LOTHAR R.;MATTHEWS ERIC M.
分类号 G01R31/01;G01R31/28;(IPC1-7):G01R31/02 主分类号 G01R31/01
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