发明名称 METHOD FOR INSPECTING DONOR, ACCEPTOR AND PATH LENGTH DEPENDENCE FOR MAXIMIZING ELECTRICAL PROPERTY OF LINEAR OR NONLINEAR OPTICAL MATERIAL
摘要 PURPOSE: A donor, acceptor and path length inspecting method for maximizing electrical property of linear or nonlinear optical material is provided to measure charge transfer optimally with simple equation, and to inspect path length dependence of the electrical property according to charge transfer and the optimized path length. CONSTITUTION: A donor and an acceptor transfer charge optimally. Electrical properties are maximized with transferring charge of linear or nonlinear optical material. The electrical property includes dipole moment, polarizability, the first hyperpolarizability and the second hyperpolarizability. The amount of optimized charge transfer related to path length of optical material is calculated with input variables including difference of electronegativity and polarizability, and path length. The calculated charge transfer amount is decided to be similar to the optimal charge transfer based on optical material corresponding to path length. The optimized donor and acceptor are inspected with extracting the donor and the acceptor having the electronegativity and polarizability similar to the optimal charge transfer.
申请公布号 KR20020018447(A) 申请公布日期 2002.03.08
申请号 KR20000051744 申请日期 2000.09.01
申请人 MHIN, BYUNG JIN 发明人 MHIN, BYUNG JIN
分类号 G01B11/00;(IPC1-7):G01B11/00 主分类号 G01B11/00
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