发明名称 Semiconductor device with an improved bonding pad structure and method of bonding bonding wires to bonding pads
摘要 The present invention provides a bonding structure between a bonding pad and a bonding portion of a bonding wire made of an Au-base material, wherein said bonding pad further comprises: a base layer; at least a barrier layer overlying said base layer; and a bonding layer overlying said at least barrier layer, said bonding layer including an Al-base material, and wherein said bonding portion of said bonding wire is buried in said bonding layer, and an Au-Al alloy layer extends on an interface between said bonding portion and said bonding layer, and a bottom of said Au-Al alloy layer is in contact with or adjacent to an upper surface of said barrier layer.
申请公布号 US2002027289(A1) 申请公布日期 2002.03.07
申请号 US20010941622 申请日期 2001.08.30
申请人 KURIHARA TOSHIMICHI;TODA TETSU;TSUBAKI SHIGEKI 发明人 KURIHARA TOSHIMICHI;TODA TETSU;TSUBAKI SHIGEKI
分类号 H01L21/60;H01L23/485;(IPC1-7):H01L23/48 主分类号 H01L21/60
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