发明名称 |
Semiconductor device with an improved bonding pad structure and method of bonding bonding wires to bonding pads |
摘要 |
The present invention provides a bonding structure between a bonding pad and a bonding portion of a bonding wire made of an Au-base material, wherein said bonding pad further comprises: a base layer; at least a barrier layer overlying said base layer; and a bonding layer overlying said at least barrier layer, said bonding layer including an Al-base material, and wherein said bonding portion of said bonding wire is buried in said bonding layer, and an Au-Al alloy layer extends on an interface between said bonding portion and said bonding layer, and a bottom of said Au-Al alloy layer is in contact with or adjacent to an upper surface of said barrier layer.
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申请公布号 |
US2002027289(A1) |
申请公布日期 |
2002.03.07 |
申请号 |
US20010941622 |
申请日期 |
2001.08.30 |
申请人 |
KURIHARA TOSHIMICHI;TODA TETSU;TSUBAKI SHIGEKI |
发明人 |
KURIHARA TOSHIMICHI;TODA TETSU;TSUBAKI SHIGEKI |
分类号 |
H01L21/60;H01L23/485;(IPC1-7):H01L23/48 |
主分类号 |
H01L21/60 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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