发明名称 |
PROBE FIXTURE CLEANING DEVICE FOR INSPECTING PRINTED WIRING BOARD |
摘要 |
PROBLEM TO BE SOLVED: To solve such a problem that there are the bending trouble of a probe and the re-staining of the probe by a contaminated brush, in a conventional method for cleaning the probe fixture for inspecting a printed wiring board by polishing the stained tip part of the probe using a brush. SOLUTION: A high pressure fluid is injected in the container 7, which is brought into close contact with a probe fixture base stand 4 in which probes 3 are planted, to peel the stain 32 bonded to the probes 3 to clean the probes 3.
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申请公布号 |
JP2002066470(A) |
申请公布日期 |
2002.03.05 |
申请号 |
JP20000254994 |
申请日期 |
2000.08.25 |
申请人 |
SANSHA ELECTRIC MFG CO LTD |
发明人 |
OKAMOTO SHIGERU;TACHIBANA HIDEHISA;TANAKA SEIJI |
分类号 |
G01R1/06;B08B3/02;B08B5/02;G01R31/28;H01L21/66;H05K3/00;(IPC1-7):B08B3/02 |
主分类号 |
G01R1/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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