发明名称 PATTERN FORMING METHOD FOR PATTERNED PLATE WITH ALIGNMENT PATTERN AND PATTERNED PLATE PATTERN-FORMED BY THE METHOD
摘要 <p>PROBLEM TO BE SOLVED: To provide a pattern forming method capable of forming alignment patterns and a regular pattern with good accuracy of positional relation in a patterned plate with alignment patterns. SOLUTION: When patterns are formed for a patterned plate with a regular pattern B such as a reticle pattern or a shadow mask pattern and alignment patterns A1, A2, A3, the alignment patterns A1, A2, A3 are formed before forming the regular pattern B and the alignment patterns A1, A2, A3 of the same shape are formed again in a superposed state after forming the regular pattern B. Relative displacement between the alignment pattern and the regular pattern varying dependently on the time of a pattern forming system while forming the regular pattern is almost completely corrected, and the lowering of the positional accuracy of pattern varying dependently on pattern size can be suppressed.</p>
申请公布号 JP2002062636(A) 申请公布日期 2002.02.28
申请号 JP20010189007 申请日期 2001.06.22
申请人 DAINIPPON PRINTING CO LTD 发明人 SHINODA TOSHIKI;TAKEZAWA TETSUO;NOGUCHI SHIGERU
分类号 G03F1/42;G03F1/76;H01J9/14;H01L21/027;(IPC1-7):G03F1/08 主分类号 G03F1/42
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