发明名称 |
METHOD FOR PRODUCING PHOTOMASK, METHOD FOR PRODUCING PHOTOMASK BLANK AND METHOD FOR REGENERATING PHOTOMASK |
摘要 |
PROBLEM TO BE SOLVED: To reutilize a photomask. SOLUTION: A light shielding pattern 3a comprising a resist film formed on a photomask M1a is removed and a new light shielding pattern comprising a resist film is formed again on the photomask M1a to regenerate the photomask. A light shielding pattern comprising a resist film formed in the integrated circuit pattern region of a mask with a light shielding pattern comprising a metal formed in the peripheral region is removed and a new light shielding pattern comprising a resist film is formed again in the integrated circuit pattern region of the mask to regenerate the mask. |
申请公布号 |
JP2002062634(A) |
申请公布日期 |
2002.02.28 |
申请号 |
JP20000246506 |
申请日期 |
2000.08.15 |
申请人 |
HITACHI LTD |
发明人 |
TANAKA TOSHIHIKO;HASEGAWA NORIO;TERASAWA TSUNEO |
分类号 |
G03F1/00;G03F1/38;G03F1/50;G03F1/54;G03F1/68;G03F1/72;H01L21/027 |
主分类号 |
G03F1/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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