发明名称 Structure of borderless contact and fabricating method thereof
摘要 An improved borderless contact structure and method of making the structure including a substrate with side walls formed on the side of the shallow trench. An insulator is formed over the side walls and in the remainder of the trench such that the insulator extends above an upper surface of the substrate. The side walls are formed of a first etch selection type and the insulator is formed of a second etch selection type.
申请公布号 US2002024103(A1) 申请公布日期 2002.02.28
申请号 US20010939594 申请日期 2001.08.28
申请人 KANG CHANG YONG;PARK SEONG HYUNG 发明人 KANG CHANG YONG;PARK SEONG HYUNG
分类号 H01L21/28;H01L21/60;H01L23/485;(IPC1-7):H01L29/76;H01L29/94 主分类号 H01L21/28
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