发明名称 Method and apparatus for user guidance in optical inspection and measurement of thin films and substrates, and software therefore
摘要 A method, apparatus, and software for guiding users during optical inspection and measurement of coated and noncoated substrates with an optical measurement system is provided. The optical measurement system incorporates an integrated recipe and data browser with sortable features to facilitate the optical inspection and measurement by the user.
申请公布号 US2002024663(A1) 申请公布日期 2002.02.28
申请号 US20010900457 申请日期 2001.07.09
申请人 SLODOWSKI MATTHIAS;IRMER KARL-HEINZ 发明人 SLODOWSKI MATTHIAS;IRMER KARL-HEINZ
分类号 H01L21/66;B01D61/02;B01D61/04;B01D61/08;B01D63/02;B01D63/04;B01D65/02;B01D65/06;C02F1/44;G01N21/21;G01N21/95;G01N21/956;G05B19/00;(IPC1-7):G02B27/32 主分类号 H01L21/66
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