发明名称 Semiconductor device and manufacturing method thereof
摘要 The present invention is a semiconductor device having the semiconductor element 1 obtained by cutting a semiconductor wafer with the electrode pad 2 formed on one side along the scribe line, the semiconductor element protective layer 7 on the semiconductor element 1 which has the opening 7(1) on the pad 2, the stress cushioning layer 3 on the layer 7 which has the opening 3(1) on the pad 2, the lead wire portion 4 reaching the layer 3 from the electrode pad 2 via the openings 7(1) and 3(1), the external electrodes 6 on the lead wire portion 4, and the conductor protective layer 5 on the layer 3 and the layer 7, the layer 3, and the conductor protective layer 5 form the respective end faces on the end surface 1(1) of the semiconductor element 1 inside the scribe line and expose the range from the end face of the end surface 1(1) to the inside of the scribe line.
申请公布号 US2002025655(A1) 申请公布日期 2002.02.28
申请号 US20010809181 申请日期 2001.03.16
申请人 SATOH TOSHIYA;OGINO MASAHIKO;SEGAWA TADANORI;YAMAGUCHI YOSHIHIDE;TENMEI HIROYUKI;KAZAMA ATSUSHI;ANJO ICHIRO;NISHIMURA ASAO 发明人 SATOH TOSHIYA;OGINO MASAHIKO;SEGAWA TADANORI;YAMAGUCHI YOSHIHIDE;TENMEI HIROYUKI;KAZAMA ATSUSHI;ANJO ICHIRO;NISHIMURA ASAO
分类号 H01L23/29;H01L21/301;H01L21/3205;H01L21/56;H01L21/60;H01L21/768;H01L23/31;H01L23/485;H01L23/52;H01L23/522;(IPC1-7):H01L21/301;H01L21/46 主分类号 H01L23/29
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