发明名称 |
Semiconductor device and manufacturing method thereof |
摘要 |
The present invention is a semiconductor device having the semiconductor element 1 obtained by cutting a semiconductor wafer with the electrode pad 2 formed on one side along the scribe line, the semiconductor element protective layer 7 on the semiconductor element 1 which has the opening 7(1) on the pad 2, the stress cushioning layer 3 on the layer 7 which has the opening 3(1) on the pad 2, the lead wire portion 4 reaching the layer 3 from the electrode pad 2 via the openings 7(1) and 3(1), the external electrodes 6 on the lead wire portion 4, and the conductor protective layer 5 on the layer 3 and the layer 7, the layer 3, and the conductor protective layer 5 form the respective end faces on the end surface 1(1) of the semiconductor element 1 inside the scribe line and expose the range from the end face of the end surface 1(1) to the inside of the scribe line.
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申请公布号 |
US2002025655(A1) |
申请公布日期 |
2002.02.28 |
申请号 |
US20010809181 |
申请日期 |
2001.03.16 |
申请人 |
SATOH TOSHIYA;OGINO MASAHIKO;SEGAWA TADANORI;YAMAGUCHI YOSHIHIDE;TENMEI HIROYUKI;KAZAMA ATSUSHI;ANJO ICHIRO;NISHIMURA ASAO |
发明人 |
SATOH TOSHIYA;OGINO MASAHIKO;SEGAWA TADANORI;YAMAGUCHI YOSHIHIDE;TENMEI HIROYUKI;KAZAMA ATSUSHI;ANJO ICHIRO;NISHIMURA ASAO |
分类号 |
H01L23/29;H01L21/301;H01L21/3205;H01L21/56;H01L21/60;H01L21/768;H01L23/31;H01L23/485;H01L23/52;H01L23/522;(IPC1-7):H01L21/301;H01L21/46 |
主分类号 |
H01L23/29 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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