发明名称 RESIST MATERIAL AND PATTERN FORMING METHOD
摘要 PURPOSE: To provide a chemical amplification positive type resist material having high contrast between the velocity of alkali dissolution before exposure and that after exposure, high sensitivity, high resolution, a good pattern shape after exposure, superior etching resistance and superior adaptability to a process. CONSTITUTION: The resist material contains a high molecular compound having repeating units of formula (1) (where R1-R3 are each H or methyl; Z is a 2-10C linear, branched or cyclic alkylene; R4 is H, a 1-10C linear, branched or cyclic alkyl or an oxygen-containing 1-10C linear, branched or cyclic alkyl; R5 is a 5-20C tertiary alkyl; (p), (q) and (r) are each a positive number and p+q+r=1) and having a weight average molecular weight of 1,000-500,000.
申请公布号 KR20020013796(A) 申请公布日期 2002.02.21
申请号 KR20010048635 申请日期 2001.08.13
申请人 SHIN-ETSU CHEMICAL CO., LTD. 发明人 HIRAHARA KAZUHIRO;KUSAKI WATARU;MAEDA KAZUNORI;NAGURA SHIGEHIRO;TAKEDA TAKANOBU;WATANABE OSAMU
分类号 C08F12/14;C08F20/12;C08F20/30;C08F220/30;C08K5/00;C08L33/04;G03F7/004;G03F7/039;H01L21/027;(IPC1-7):G03F7/004 主分类号 C08F12/14
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