发明名称 Method used for producing a source or drain region of a transistor in a semiconductor substrate comprises growing the source or drain region doped in situ with selective epitaxy
摘要 Method used for producing a source or drain region (17) of a transistor (32) in a semiconductor substrate (1) comprises growing the source or drain region doped in situ with selective epitaxy. Preferred Features: A mask layer (16) is arranged on a surface of the substrate. Part of the mask layer is removed, and a mask window (19) reveals a first region of the substrate surface. The selective epitaxy grows on the first region of the substrate surface and does not grow on a second region of the substrate surface covered by the mask layer. A doped profile having different concentrations of doping medium is produced on formation of the source or drain region.
申请公布号 DE10037248(A1) 申请公布日期 2002.02.21
申请号 DE20001037248 申请日期 2000.07.31
申请人 INFINEON TECHNOLOGIES AG 发明人 MUELLER, KARLHEINZ;WOLF, KONRAD
分类号 H01L21/8238;(IPC1-7):H01L21/336;H01L21/823 主分类号 H01L21/8238
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