发明名称 |
Method used for producing a source or drain region of a transistor in a semiconductor substrate comprises growing the source or drain region doped in situ with selective epitaxy |
摘要 |
Method used for producing a source or drain region (17) of a transistor (32) in a semiconductor substrate (1) comprises growing the source or drain region doped in situ with selective epitaxy. Preferred Features: A mask layer (16) is arranged on a surface of the substrate. Part of the mask layer is removed, and a mask window (19) reveals a first region of the substrate surface. The selective epitaxy grows on the first region of the substrate surface and does not grow on a second region of the substrate surface covered by the mask layer. A doped profile having different concentrations of doping medium is produced on formation of the source or drain region.
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申请公布号 |
DE10037248(A1) |
申请公布日期 |
2002.02.21 |
申请号 |
DE20001037248 |
申请日期 |
2000.07.31 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
MUELLER, KARLHEINZ;WOLF, KONRAD |
分类号 |
H01L21/8238;(IPC1-7):H01L21/336;H01L21/823 |
主分类号 |
H01L21/8238 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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