| 摘要 |
PURPOSE: To provide a semiconductor storage which can perform a test while keeping quality even when test pins of a test device are tewer than address pins or data pins of the semiconductor storage. CONSTITUTION: The semiconductor storage is provided with an internal circuit 20. The internal circuit 20 comprises a command user interface 21, a logic circuit 22, and a pad 23. The command user interface 21 outputs signals A, B of a H level or a L level based on a fixed command from the outside. When a signal A of a H level and a signal B of a L level are inputted, the logic circuit 22 outputs a fixed logic signal KCA of a H level independently of a signal from the pad 23, when a signal A of a L level and a signal B of a H level are inputted, the circuit 22 outputs the fixed logic signal KCA of a L level independently of a signal from the pad 23.
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