| 摘要 |
PROBLEM TO BE SOLVED: To provide a characteristic measuring apparatus by which the light intensity of a laser beam from a semiconductor laser unit and the distribution of the light intensity can be measured. SOLUTION: The characteristic measuring apparatus measures the characteristic of the laser beam 14 from the semiconductor laser unit 7 which is provided with a semiconductor laser 9, a lens 10 which converges a laser beam from the semiconductor laser 9 and an aperture 12 which shapes a laser beam from the lens 10. The apparatus is provided with a first light receiving element 1 which measures the light intensity of the laser beam from the unit 7 and a second light receiving element 2 which measures the distribution of the light intensity of the laser beam 14. The first and second elements 1, 2 are constituted so as to comprise a light receiving area which is larger than the area of the opening 12a of the aperture 12.
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