FLUORESCENT X-RAY SPECTROMETER

摘要

PROBLEM TO BE SOLVED: To provide a device facilitating verification whether an analysis condition of a registered background measurement angle position and the like are suitable for a sample to be analyzed or not in a wavelength-dispersive scanning type fluorescent X-ray spectrometer. SOLUTION: In a peak profile by 2θscanning obtained on an optional sample 1, background estimation intensity obtained on the sample 1 and the registered background measurement angle position serving as the basis for estimation of the background estimation intensity are displayed while overlapped to the profile.