发明名称 DEVICE FOR TESTING SEMICONDUCTOR MEMORY
摘要 PROBLEM TO BE SOLVED: To generate packet signals of many kinds which are generated by selecting and taking out a pattern signal according to setting data, and arranging different pattern signals in the direction of time series with a data setting section of small scale. SOLUTION: A device is constituted so that operation of data selection control sections SEL-A to SEL-H reading out setting data can be performed independently, and packet signals of different kinds can be generated irrespectively of absence/presence of packet signals of other kinds. Thereby, data setting sections PDS-A to PDS-H have only to prepare one group of setting data to generate each packet signal.
申请公布号 JP2002050196(A) 申请公布日期 2002.02.15
申请号 JP20000235635 申请日期 2000.08.03
申请人 ADVANTEST CORP 发明人 TSUDO MASARU
分类号 G01R31/28;G06F12/16;G11C29/10;G11C29/56;(IPC1-7):G11C29/00 主分类号 G01R31/28
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