发明名称 Manufacture of semiconductor device with copper wiring
摘要 A method of manufacturing a semiconductor device has the steps of: (a) preparing a semiconductor substrate formed with an insulating layer having a wiring recess; and (b) forming a conductive layer by chemical vapor deposition on a surface of the semiconductor substrate including an inner surface of the wiring recess, while lamp light is applied to the semiconductor substrate, the conductive layer being substantially made of copper. With this method, Cu wiring having a high adhesion force is formed by chemical vapor deposition.
申请公布号 US2002019131(A1) 申请公布日期 2002.02.14
申请号 US20010811525 申请日期 2001.03.20
申请人 FUJITSU LIMITED 发明人 OHTSUKA NOBUYUKI;SHIMIZU NORIYOSHI
分类号 C23C16/18;H01L21/28;H01L21/285;H01L21/3205;H01L21/768;H01L23/52;(IPC1-7):H01L21/44 主分类号 C23C16/18
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