摘要 |
<p>An apparatus (24) is provided for continuously monitoring an edge (21) of a strip (14) of material, which apparatus includes a pair of parallel, closely spaced laser detectors (40). The parallel laser detectors (40) include a first laser detector (40a)including a first projector (70) for projecting a first laser beam at the edge (21) in a direction perpendicular to the direction of movement of the strip (14) and perpendicular to the edge (21) and a first profile detector (72) for detecting a portion of the first laser beam passing over the edge (21) and for generating a first signal representing the detected portion of the first laser beam; and a second laser detector (40b), in close proximity to the first laser system, including a second projector (70), for projecting a second laser beam at the edge (21) in a direction perpendicular to the direction of movement of the strip (14) and perpendicular to the cutting edge (21) and a second profile detector (72) for detecting a portion of the second laser beam passing over the edge (21) and for generating a second signal representing the detected portion of the second laser beam. <IMAGE></p> |