发明名称 Combination of imaging and scanning methods for checking reticles
摘要 A scanning device (37) is positioned above the coated surface of the mask (32) and an optical microscope (34) below. Initially their positions are adjusted until the scanning point (38) of the scanning device is visible in the microscope image, i.e. they are lined up on the ON-axis. Thereafter they are retained in these relative positions whilst the table (33) holding the mask is adjusted in the x,y directions by step motors (41,42) to inspect the mask.
申请公布号 EP1179748(A2) 申请公布日期 2002.02.13
申请号 EP20010118529 申请日期 2001.08.01
申请人 INFINEON TECHNOLOGIES AG 发明人 ROTSCH, CHRISTIAN
分类号 G01M11/02;G01N21/956;G01Q30/02;G01Q40/00;G02B21/00;G03F1/00 主分类号 G01M11/02
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