| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor memory in which delicate defective cut of a fuse can be surely detected. SOLUTION: A pad giving a power source potential to a path in which a current is made to flow forward a ground node through a fuse element is provided independently separating from a pad giving a power source potential to the other circuit. A current flowing in a fuse can be measured by a tester, a minute current can be detected, delicate and defective cut can be detected.
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