发明名称 Semiconductor device and method for fabricating the same
摘要 A semiconductor device of this invention includes a first interconnect pattern formed on a semiconductor substrate and a second interconnect pattern formed above the first interconnect pattern with an interlayer insulating film sandwiched therebetween. The first interconnect pattern includes a dummy pattern insulated from the first interconnect pattern, and the dummy pattern includes a plurality of fine patterns adjacent to each other and air gaps formed between the adjacent fine patterns.
申请公布号 US2002014697(A1) 申请公布日期 2002.02.07
申请号 US20010899860 申请日期 2001.07.09
申请人 TAMAOKA EIJI;NAKAGAWA HIDEO 发明人 TAMAOKA EIJI;NAKAGAWA HIDEO
分类号 H01L23/52;H01L21/3105;H01L21/3205;H01L21/768;H01L21/822;H01L23/522;H01L27/04;(IPC1-7):H01L21/476;H01L23/48;H01L29/40 主分类号 H01L23/52
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